Collection search - Cross section of a transistor, taken with a transmission electron microscope. Enlargement 22,000 times. This view indicated possible reliability problems and led to changes in fabrication methods
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Record information – Brief 
Cross section of a transistor, taken with a transmission electron microscope. Enlargement 22,000 times. This view indicated possible reliability problems and led to changes in fabrication methods
Hierarchical level:ItemDate:n.d.Type of material:PhotographsFound in:Archives / Collections and FondsItem ID number:3242127Context of this record: -
Record information – Details Date(s):n.d.Place:Ottawa, Ont.Place of creation:No place, unknown, or undeterminedExtent:1 photograph ; Original was a loaned item
Positive Paper Silver - gelatineLanguage of material:no languageSource:Private -
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